TITLE

Rietveld analysis using a laboratory-based high pressure x-ray diffraction system and film-based

AUTHOR(S)
Hasegawa, Masashi; Badding, John V.
PUB. DATE
June 1997
SOURCE
Review of Scientific Instruments;Jun97, Vol. 68 Issue 6, p2298
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Reports on Rietveld structure refinement using a laboratory-based high pressure x-ray diffraction system and film-based detection. Experimental apparatus and conditions; Three examples of successful Rietveld refinements; Film calibration and absorption correction; Peak profile and Rietveld analysis.
ACCESSION #
4290465

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics