Improved nm displacement detector for microscopic beads at frequencies below 10 Hz

Daqun Li; Schnapp, Bruce J.
May 1997
Review of Scientific Instruments;May97, Vol. 68 Issue 5, p2195
Academic Journal
Describes the design of a modular differential interference contrast microscope combined with laser interferometry to detect nanometer-scale displacements of microscopic beads with a root mean square noise less than 0.4 nanometer. Instrumentation design and setup; Detection sensitivity; Disadvantage of using the system as a displacement detector.


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