Sapphire resonator for the measurement of surface impedance of high-temperature superconducting

Ormeno, R.J.; Morgan, D.C.; Broun, D.M.; Lee, S.F.; Waldman, J.R.
May 1997
Review of Scientific Instruments;May97, Vol. 68 Issue 5, p2121
Academic Journal
Describes the development of a technique using cavity perturbation of a cooled sapphire disk resonator to measure the surface impedance of high-temperature superconducting thin films. Excitation of the resonator in the TE[sub 011] mode; Thermal isolation of the sample; Surface resistance and reactance.


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