Ac-mode atomic force microscope imaging in air and solutions with a thermally driven bimetallic

Hillier, Andrew C.; Bard, Allen J.
May 1997
Review of Scientific Instruments;May97, Vol. 68 Issue 5, p2082
Academic Journal
Describes the development of an alternating current imaging mode for atomic force microscopy that employs a thermally driven bimetallic cantilever to sense surface topography. Variety of substrates used for imaging; Thermal response of the bimetallic cantilever; Response of the cantilever to resistive heating; Improvement of the image quality obtained.


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