A compact ultrahigh vacuum x-ray diffractometer for surface glancing scattering using a

Fujii, Yoshikazu; Yoshida, Kenji; Nakamura, Takeshi; Yoshida, Kentaroh
May 1997
Review of Scientific Instruments;May97, Vol. 68 Issue 5, p1975
Academic Journal
Describes the design and fabrication of a compact ultrahigh vacuum (UHV) x-ray diffractometer using a small rotating-anode x-ray source of 18 kilowatts. Dimension of the UHV specimen chamber; Measurements of the incident angles and angular distributions of the scattered x-ray intensity; Suitability of the apparatus in in situ observations of crystal surface growth.


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