Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer

Drescher, M.; Snell, G.; Kleineberg, U.; Stock, H.-J.; Muller, N.; Heinzmann, U.; Brookes, N.B.
May 1997
Review of Scientific Instruments;May97, Vol. 68 Issue 5, p1939
Academic Journal
Utilizes a W/Si multilayer polarimeter to determine the degree of circular polarization of the soft x-ray radiation of the European Synchrotron Radiation Facility helical undulator HELIOS I. Fabrication of the multilayer polarimeter; Multilayer characterization; Determination of the degree of circular polarization; Characterization of HELIOS I.


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