TITLE

Micro-Raman spectroscopy of electromigration-induced oxygen vacancy aggregation in

AUTHOR(S)
Moeckly, B.H.; Buhrman, R.A.; Sulewski, P.E.
PUB. DATE
March 1994
SOURCE
Applied Physics Letters;3/14/1994, Vol. 64 Issue 11, p1427
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the influence of a high current bias on the basal-plane chain-oxygen vacancy motion in YBa[sub 2]Cu[sub 3]O[sub 7-delta] thin films. Use of micro-Raman spectroscopy and optical microscopy; Enhancement of oxygen order in the region of highest current density; Complex accumulation of oxygen vacancy in the region.
ACCESSION #
4289601

 

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