Thickness dependence of the electrical characteristics of chemical vapor deposited diamond films

Plano, M.A.; Zhao, S.; Gardinier, C.F.; Landstrass, M.I.; Kania, D.R.; Kagan, H.; Gan, K.K.; Kass, R.; Pan, L.S.; Han, S.; Schnetzer, S.; Stone, R.
January 1994
Applied Physics Letters;1/10/1994, Vol. 64 Issue 2, p193
Academic Journal
Measures the electrical properties of chemical vapor deposited diamond films. Use of time-resolved transient photoconductivity and charged-particle induced conductivity; Implications for diamond electronic uses; Link of collection distance with grain size.


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