Polarization and wavelength dependence of metal-semiconductor-metal photodetector response

Kuta, J.J.; van Driel, H.M.; Landheer, D.; Adams, J.A.
January 1994
Applied Physics Letters;1/10/1994, Vol. 64 Issue 2, p140
Academic Journal
Examines the polarization and wavelength dependence of metal-semiconductor-metal photodetector response. Measurement of device efficiency between orthogonal polarizations; Effect of dispersion on the dielectric constant of the substrate; Factor responsible for determining the effect of electrode structure on the photodetector response.


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