TITLE

Quantitative characterization of epitaxial superlattices by x-ray diffraction and high

AUTHOR(S)
Fullerton, Eric E.; Wei Cao; Thomas, Gareth; Schuller, Ivan K.; Carey, Matthew J.; Berkowitz, Ami E.
PUB. DATE
July 1993
SOURCE
Applied Physics Letters;7/26/1993, Vol. 63 Issue 4, p482
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Characterizes the epitaxial cobalt oxide/nickel oxide superlattice. Use of x-ray diffraction and high resolution electron microscopy; Growth of the superlattice by reactive sputtering; Comparison of the calculated diffraction intensities of a structural model with the measured quantitative intensity.
ACCESSION #
4289446

 

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