TITLE

Atomic force microscopy on homoepitaxial SrTiO[sub 3] films grown under monitoring of intensity

AUTHOR(S)
Yoshimoto, M.; Ohkubo, H.; Kanda, N.; Koinuma, H.; Horiguchi, K.; Kumagai, M.; Hirai, K.
PUB. DATE
November 1992
SOURCE
Applied Physics Letters;11/30/1992, Vol. 61 Issue 22, p2659
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the epitaxial growth of strontium titanate films (SrTiO[sub 3]) under intensity oscillation monitoring in reflection high energy electron diffraction. Application of atomic force microscopy; Impact of the homoepitaxial films on surface flattening; Verification of the crystal quality in the SrTiO[sub 3] films.
ACCESSION #
4289403

 

Related Articles

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics