Structural characterization and microwave loss of Nd[sub 1.85]Ce[sub 0.15]CuO[sub 4-y]

Mao, S.N.; Xi, X.X.
January 1994
Applied Physics Letters;1/17/1994, Vol. 64 Issue 3, p375
Academic Journal
Examines the characterization and microwave loss of Nd-based superconducting thin films on yttria-stabilized zirconia buffered sapphire. Role of Rutherford backscattering spectroscopy in determining channeling yield; Evidence of cross-sectional images through transmission electron microscopy; Depiction of surface resistance dependence on temperature.


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