TITLE

Semiconductor laser cavity dispersion measurement based on interferometric crosscorrelation of

AUTHOR(S)
Naganuma, Kazunori
PUB. DATE
January 1994
SOURCE
Applied Physics Letters;1/17/1994, Vol. 64 Issue 3, p261
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the use of interferometric crosscorrelation Fourier transform method of amplified spontaneous emission in measuring cavity dispersion. Function of subfringe using the Fourier transform in cavity transfer; Use of the method in semiconductor devices for a quick delay dispersion and gain measurement; Role of nonlasing state in the universal use of method.
ACCESSION #
4284387

 

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