TITLE

Energy band lineup at the porous-silicon/silicon heterointerface measured by electron spectroscopy

AUTHOR(S)
Hao, P.H.; Hou, X.Y.
PUB. DATE
June 1994
SOURCE
Applied Physics Letters;6/27/1994, Vol. 64 Issue 26, p3602
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Measures the energy band gap of light-emitting porous silicon by high-resolution electron energy loss spectroscopy (HREELS). Technical difficulties of the methods used for semiconductor heterojunction systems; Purpose of developing the HREELS technique; Interference of surface oxidation on the HREELS and ultraviolet photoelectron spectroscopy.
ACCESSION #
4278302

 

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