A novel digital feedback scheme of shear-force control in near-field scanning optical microscopy

Ki Hyun Kim; Sang-Kee Eah; Byoungho Lee; Chang Ho Cho
July 1997
Review of Scientific Instruments;Jul97, Vol. 68 Issue 7, p2783
Academic Journal
Describes the development of a novel digital feedback scheme of distance control via shear-force measurement in the near-field scanning optical microscope. Achievement of full digital control using simple comparators; Obtained feedback motion.


Related Articles

  • A nonoptical tip-sample distance control method for near-field scanning optical microscopy using... Hsu, J.W.P.; Lee, Mark; Deaver, B.S. // Review of Scientific Instruments;May95, Vol. 66 Issue 5, p3177 

    Presents a shear-force feedback method to regulate tip-sample distance for near-field scanning optical microscopy. Electromechanical distance regulation; Shear-force image of a gold-coated grating taken with the nonoptical impedance change feedback; Achievement of the tip-sample distance...

  • An easy-to-use non-optical shear-force distance control for near-field optical microscopes. Barenz, J.; Hollricher, O.; Marti, O. // Review of Scientific Instruments;May96, Vol. 67 Issue 5, p1912 

    Presents an easy-to-use non-optical shear-force detection system for tip-sample distance control in scanning near-field optical microscopes. Review of distance controls; Piezo-acoustic detected shear-force; Main advantage of the setup.

  • Distance control in near-field optical microscopy with piezoelectrical shear-force detection... Brunner, R.; Bietsch, A.; Hollricher, O.; Marti, O. // Review of Scientific Instruments;Apr97, Vol. 68 Issue 4, p1769 

    Introduces an improved piezoelectric shear-force feedback system for tip-sample distance control in a scanning near-field optical microscope. Piezoelectrical shear-force setup; Fiber amplitude; Topographical resolution obtained; Measurements in water.

  • A design of reflection scanning near-field optical microscope and its application to AlGaAs/GaAs.... Guttroff, G.; Keto, J.M. // Applied Physics Letters;6/17/1996, Vol. 68 Issue 25, p3620 

    Presents a feedback mechanism for scanning near-field optical microscope (SNOM). Impact of multiple fibers with numerical apertures on the reflection geometry; Use of silicon-grating sample to test the performance of SNOM; Application of the feedback mechanism to aluminum arsenide/aluminum...

  • Piezoelectric shear force detection: A geometry avoiding critical tip/tuning fork gluing Salvi, J.; Chevassus, P.; Mouflard, A.; Davy, S.; Spajer, M.; Courjon, D.; Hjort, K.; Rosengren, L. // Review of Scientific Instruments;Apr98, Vol. 69 Issue 4, p1744 

    Presents a technique for controlling the tip-sample distance in near-field optical microscopes. Use of a tuning fork to control shear force distance; Simplification of tip replacement and resonance frequency tuning; Sensitivity of the method.

  • Direct measurement of the oscillation amplitude and criteria for high-quality images in shear force microscopy. Brückl, H.; Matthes, F.; Reiss, G. // Applied Physics A: Materials Science & Processing;1998, Vol. 66 Issue 7, pS345 

    Abstract. While the origins of the physical mechanisms am still under discussion, shear force is widely used in near-field scanning optical microscopes as an independent distance control. In this paper we present investigations of one of the most crucial parameters influencing the quality of...

  • A distance regulation scheme for scanning near-field optical microscopy. Drabenstedt, A.; Wrachtrup, J. // Applied Physics Letters;6/10/1996, Vol. 68 Issue 24, p3497 

    Presents a scheme for detecting shear force distance regulation in scanning near-field optical microscopy. Development of a piezoelectric pickup to eliminate detection of vibrations and damping; Sensitivity of the technique compared to the optical scheme; Effectiveness of the technique in...

  • Dynamic behavior of tuning fork shear-force feedback. Ruiter, A.G.; Veerman, J.A.; van der Werf, K.O.; van Hulst, N.F. // Applied Physics Letters;7/7/1997, Vol. 71 Issue 1, p28 

    Examines the dynamics of tuning fork shear-force feedback system used in near-field scanning optical microscope. Detection scheme used in measuring the tuning fork amplitude; Decrease in fork oscillation amplitude upon approaching sample surface; Numerical simulation of the second-order tuning...

  • Scanning capacitance microscopy on a 25 nm scale. Williams, C. C.; Hough, W. P.; Rishton, S. A. // Applied Physics Letters;7/10/1989, Vol. 55 Issue 2, p203 

    A near-field capacitance microscope has been demonstrated on a 25 nm scale. A resonant circuit provides the means for sensing the capacitance variations between a sub-100-nm tip and surface with a sensitivity of 1×10-19 F in a 1 kHz bandwidth. Feedback control is used to scan the tip at...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics