Molecular scale alignment strategies: An investigation of Ag adsorption on patterned fullerene

Dunn, A.W.; Cotier, B.N.
November 1997
Applied Physics Letters;11/17/1997, Vol. 71 Issue 20, p2937
Academic Journal
Examines the use of metallic and etched registration marks to identify and relocate individual molecules in positions determined with respect to macroscopic features of semiconductor surfaces. Analysis of the deposition of silver on a patterned fullerene multilayer; Use of scanning electron microscope; Resistance of metallic marks to thermal cycling.


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