Glancing angle x-ray diffraction: A different approach

van Brussel, B.A.; De Hosson, J.Th.M.
March 1994
Applied Physics Letters;3/21/1994, Vol. 64 Issue 12, p1585
Academic Journal
Describes a technique of diffracted beam glancing angle x-ray diffraction. Determination of the depth profiles of stresses and transformed phases in structures like implanted materials; Application of technique in a standard powder diffractometer; Ways to perform glancing x-ray diffraction.


Related Articles

  • Effect of the x-ray beam collimation on the resolution of an energy dispersive diffractometer. Rossi Albertini, Valerio; Paci, Barbara // Review of Scientific Instruments;Sep2002, Vol. 73 Issue 9, p3160 

    Although the energy dispersive x-ray diffraction (EDXD) technique has proved to have several merits in comparison with its conventional angular dispersive counterpart, it has the serious drawback that its resolution is intrinsically lower than that of the latter. This makes EDXD unsuitable each...

  • X-ray diffraction by moving objects: A new application of synchrotron radiation. Ihringer, J.; Wroblewski, T. // Review of Scientific Instruments;Jul1989, Vol. 60 Issue 7, p2354 

    A parallel-beam geometry with analyzer crystal is used for x-ray diffraction experiments on fastmoving machine parts. With this method in rotating samples, like turbine blades, strain can be measured in different directions with respect to the acting force by appropriate choice of the...

  • Structures of crystalline mixed peganole-brompeganole systems. Tozhiboev, A.; Tashkhodzhaev, B.; Turgunov, K.; Mukarramov, N.; Shakhidoyatov, Kh. // Journal of Structural Chemistry;May2007, Vol. 48 Issue 3, p534 

    The structures of mixed crystals — solid solutions in the peganole-brompeganole system with molar ratios 0.72:0.28, 0.32:0.68, 0.10:0.90 and of pure peganole are determined by single crystal X-ray diffraction. It is shown that the solid solutions (mixed crystals) exist as three different...

  • Crossover between strong- and weak-field critical adsorption and the determination of the universal exponent η[sub ⊥]. Nickel, B.; Schlesener, F.; Donner, W.; Dosch, H.; Detlefs, C. // Journal of Chemical Physics;7/8/2002, Vol. 117 Issue 2, p902 

    We report a temperature-dependent x-ray diffraction study of critical behavior of sublattice order in thin epitaxial FeCo(001) films grown on MgO(001). The quantitative analysis of the diffraction profiles reveals a crossover phenomenon between strong-field and weak-field critical adsorption...

  • X-ray diffraction reciprocal space mapping study of the thin film phase of pentacene. Yoshida, Hiroyuki; Inaba, Katsuhiko; Sato, Naoki // Applied Physics Letters;4/30/2007, Vol. 90 Issue 18, p181930 

    The structure of the thin film phase of pentacene was investigated using x-ray diffraction reciprocal space mapping (RSM). The crystal structure was found to be triclinic with the following lattice parameters: a=0.593 nm, b=0.756 nm, c=1.565 nm, α=98.6°, β=93.3°, and γ=89.8°....

  • Determining Parameters of a Multilayer Heterostructure by Joint Analysis of the X-ray Rocking Curves Measured for Various Crystallographic Planes. Lomova, A. A.; Chuev, M. A.; Ganina, G. V. // Technical Physics Letters;May2004, Vol. 30 Issue 5, p441 

    The X-ray rocking curves of (004), (113), and (115) planes of a pseudomorphous InxGa1 – xAs/GaAs(001) heterostructure with a single 12-nm-thick quantum well were measured by double-crystal X-ray diffractometry. The joint fitting of the X-ray diffraction curves for various crystallographic...

  • Calculation of the Spherical Aberration of a Lens in the Problems of Propagation of Laser Radiation in Optical Systems. Solov’ev, D. A.; Serov, R. V. // Optics & Spectroscopy;Aug2001, Vol. 91 Issue 2, p317 

    An algorithm for the calculation of the spherical aberration in diffraction problems is proposed, which does not require the knowledge of a priori information on the incident radiation. The principle of the algorithm consists in the use of four phase screens in appropriate planes, which makes it...

  • Formation of diffraction-free beams by laser generation of conical radiation in a Kerr medium. Drampyan, R.K. // Applied Physics B: Lasers & Optics;1999, Vol. 68 Issue 1, p77 

    Abstract. The formation of diffraction-five light beams, using the nonlinear effect of laser generation of conical emission in a Kerr medium, have been studied experimentally. The parameters of obtained light beams may be described by characteristics of theoretically predicted Bessel--Gauss beams.

  • Measuring longitudinal displacements using laser beam diffraction changes near the focal point. Yamashita, Tadaoki; Nakashima, Hirotaka; Nagashima, Michiyoshi; Nishiuchi, Kenichi // Review of Scientific Instruments;Aug1993, Vol. 64 Issue 8, p2245 

    A nanometer displacement probe is created by using a knife edge, a two-part-divided photodiode, and high quality lenses. The laser beam, of wavelength 780 nm, is focused on the sample surface, where the image formed of the beam is read by the photodiode through the same optical path. The...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics