TITLE

Temperature controlled microstage for an atomic force microscope

AUTHOR(S)
Musevic, I.; Slak, G.; Blinc, R.
PUB. DATE
July 1996
SOURCE
Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2554
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents a temperature controlled microstage for an atomic force microscope (AFM). Performances of AFM in air at elevated temperatures; Achieving atomic resolution.
ACCESSION #
4271710

 

Related Articles

  • Smart Scopes Make Sense of Cellular Structures. Shaw, Gina // Drug Discovery & Development;May2005, Vol. 8 Issue 5, p48 

    Discusses researchers' efforts to push the boundaries by integrating automation, software and microscopes to work around limitations presented by atomic force microscopy. Description of an automated microscope built by Steven Finkbeiner to discover what the inclusion bodies of mutated Huntington...

  • Unstable amplitude and noisy image induced by tip contamination in dynamic force mode atomic force microscopy. Nie, H.-Y.; McIntyre, N. S. // Review of Scientific Instruments;Feb2007, Vol. 78 Issue 2, p023301 

    Liquid 1-decanethiol was confined on an atomic force microscope (AFM) tip apex and the effect was investigated by measuring amplitude-distance curves in dynamic force mode. Within the working distance in the dynamic force mode AFM, the thiol showed strong interactions bridging between a...

  • Improved atomic force microscope cantilever performance by ion beam modification. Hodges, Alex R.; Bussmann, Konrad M.; Hoh, Jan H. // Review of Scientific Instruments;Oct2001, Vol. 72 Issue 10, p3880 

    The performance of atomic force microscopy cantilevers, as measured by the resonant frequency and spring constant, is directly dependent on the shape of the cantilever. Here we have improved the performance of conventional silicon nitride cantilevers by using focused ion beam milling to minimize...

  • A new force controlled atomic force microscope for use in ultrahigh vacuum. Jarvis, S.P.; Yamada, H.; Yamamoto, S.-I.; Tokumoto, H. // Review of Scientific Instruments;Jun96, Vol. 67 Issue 6, p2281 

    Reports on the introduction of a magnetic force controlled atomic force microscope and point contact probe for use in ultrahigh vacuum. Provision of quantitative information on the nature of tip-surface interaction; Enhancement of the current capabilities of scanning probe microscopes; Method...

  • Force microscopy with a bidirectional capacitance sensor. Neubauer, Gabi; Cohen, Sidney R.; McClelland, Gary M.; Horne, Don; Mate, C. Mathew // Review of Scientific Instruments;Sep90, Vol. 61 Issue 9, p2296 

    A new method for sensing cantilever deflection in the atomic force microscope (AFM), based on capacitance measurement, is described. Parameters governing the design of such an instrument are considered in detail. Two different geometries are compared, wire on plate and an integrated flat plate...

  • Probing microplatform for the study of biological adhesion forces. Whisman, N.; York, D.; Manning, L.; Brant, J.; Dyer, R.; Childress, A.; Marchand, E.A.; Adams, J.D. // Review of Scientific Instruments;Oct2003, Vol. 74 Issue 10, p4491 

    A tool for the study of biological adhesion forces with the atomic force microscope (AFM) is introduced. The tool, a “microplatform,” can be functionalized with variety of specimens such as bacterial cells and used to study adhesion between the specimen and a surface. This tool is...

  • Atomic force microscope with improved scan accuracy, scan speed, and optical vision. Joonhyung Kwon; Jaewan Hong; Yong-Seok Kim; Dong-Youn Lee; Kyumin Lee; Sang-min Lee; Sang-il Park // Review of Scientific Instruments;Oct2003, Vol. 74 Issue 10, p4378 

    We have developed a new atomic force microscope (AFM), with a z scanner independent of the xy scanner. Unlike conventional AFM systems, our xy scanner moves only the sample in the xy plane, while the z scanner controls the AFM probe along the z axis. The xy scanner is a single module...

  • Low-cost modification of a contact atomic force microscope (AFM) into a sound-activated tapping... Vinckier, Anja; Hennau, Frans; Kjoller, Kevin; Hellemans, Louis // Review of Scientific Instruments;Feb1996, Vol. 67 Issue 2, p387 

    Presents a low-cost implementation of tapping mode atomic force microscope (AFM) on a commercial instrument. Tapping mode AFM in air; Tapping mode AFM in liquid.

  • Scanned-cantilever atomic force microscope. Baselt, David R.; Baldeschwieler, John D. // Review of Scientific Instruments;Apr93, Vol. 64 Issue 4, p908 

    We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics