Temperature controlled microstage for an atomic force microscope

Musevic, I.; Slak, G.; Blinc, R.
July 1996
Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2554
Academic Journal
Presents a temperature controlled microstage for an atomic force microscope (AFM). Performances of AFM in air at elevated temperatures; Achieving atomic resolution.


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