TITLE

Interferometric measurements of electric field-induced displacements in piezoelectric thin films

AUTHOR(S)
Kholkin, A.L.; Wutchrich, Ch.; Taylor, D.V.; Setter, N.
PUB. DATE
May 1996
SOURCE
Review of Scientific Instruments;May96, Vol. 67 Issue 5, p1935
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Reports interferometric measurements of electric field-induced displacements in piezoelectric thin films using single-beam and double-beam optical detection schemes. Bending effect on the displacements measured by single-beam interferometer; Double-beam interferometer for piezoelectric measurements in thin films; Measurements in ferroelectric thin films.
ACCESSION #
4271665

 

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