An easy-to-use non-optical shear-force distance control for near-field optical microscopes

Barenz, J.; Hollricher, O.; Marti, O.
May 1996
Review of Scientific Instruments;May96, Vol. 67 Issue 5, p1912
Academic Journal
Presents an easy-to-use non-optical shear-force detection system for tip-sample distance control in scanning near-field optical microscopes. Review of distance controls; Piezo-acoustic detected shear-force; Main advantage of the setup.


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