Compact design for real time in situ atmospheric trace gas detection based on mirage effect

Zimering, B.; Boccara, A.C.
May 1996
Review of Scientific Instruments;May96, Vol. 67 Issue 5, p1891
Academic Journal
Presents a compact and rugged setup for real time in situ trace gas detection based on photothermal deflection spectroscopy. Setup description; Sensitivity improvement; Detection limit; Possible applications of the system.


Related Articles

  • Remote chemical sensing and recognition by acoustic mapping of photothermal fields. Ming Su; Thundat, Thomas // Applied Physics Letters;5/8/2006, Vol. 88 Issue 19, p194103 

    A remote chemical sensing and recognition approach is developed based on the acoustic mapping of photothermal fields, which has been verified in transmission and reflection modes using a system with ultrasonic transducers, a light source, and light filters. Light absorption increases sample...

  • Simple color center laser optothermal molecular beam spectrometer for high-resolution infrared spectroscopy. Kyrö, E. K.; Shoja-Chaghervand, P.; Eliades, M.; Danzeiser, D.; Bevan, J. W. // Review of Scientific Instruments;Jan1986, Vol. 57 Issue 1, p1 

    A broadband tunable single-frequency color center laser optothermal molecular beam spectrometer has been constructed. K components have been resolved for P(18) to R(11) rovibrational transitions in ν1 CH3C≡C–H. The observed transition linewidths are demonstrated to be ≤6...

  • Measurement of air gap thickness underneath an opaque film by pulsed photothermal radiometry. Tam, A. C.; Sontag, H. // Applied Physics Letters;12/29/1986, Vol. 49 Issue 26, p1761 

    We describe an experimental method to detect and measure a thin air gap between an opaque film and a substrate. The method is pulsed photothermal radiometry with signal shape analysis at suitable delayed times. This relies on the use of a short light pulse to heat up the surface of the opaque...

  • Standing light wave in front of a silver mirror investigated by photothermal spectroscopy. Knoll, Wolfgang; Coufal, Hans J. // Applied Physics Letters;9/21/1987, Vol. 51 Issue 12, p892 

    Photothermal spectra of an isocyanine dye monolayer, separated from a silver mirror by a varying number of cadmium arachidate layers, are recorded with a pyroelectric calorimeter. The spatial dependence of the light intensity in front of the silver mirror is observed. The phase angle of a light...

  • Simple model for the time dependence of the periodically excited crossed-beam thermal lens. Weimer, Wayne A.; Dovichi, Norman J. // Journal of Applied Physics;1/1/1986, Vol. 59 Issue 1, p225 

    Presents a study which described a model for the time dependence of the periodically excited crossed-beam thermal lens. Theoretical considerations; Experiment; Results and discussion.

  • Vector model analysis in nondestructive imaging by using the photothermal deflection methods. Kawahara, T.; Miyazaki, M.; Kimura, A.; Okamoto, Y.; Morimoto, J.; Miyakawa, T. // Applied Physics A: Materials Science & Processing;1999, Vol. 69 Issue 3, p343 

    Abstract. The noncontact imaging of the buried structures is carried out in the open-air atmosphere by using the photothermal deflection (PTD) method. We applied these techniques to the layered samples. Besides the PTD images for the optically opaque buried structures, the parameters of the...

  • Nonresonant absorption coefficient of single-crystal films of polydiacetylene measured by photothermal deflection spectroscopy. Thakur, M.; Frye, R. C.; Greene, B. I. // Applied Physics Letters;3/19/1990, Vol. 56 Issue 12, p1187 

    Using photothermal deflection spectroscopy we have measured the nonresonant absorption coefficient of poly (bis-p-toluene sulfonate) of 2,4 hexadiyne-1,6 diol (PTS) single-crystal films for the first time. The absorption coefficient continuously decreases from the reported peak value of...

  • Nonlinear photothermal imaging. Rajakarunanayake, Y. N.; Wickramasinghe, H. K. // Applied Physics Letters;1/20/1986, Vol. 48 Issue 3, p218 

    A new technique is described whereby one can extract the nonlinear photothermal properties of a sample in photothermal microscopy. The basic scheme relies on chopping a pump heating beam at ω and detecting the temperature variation of the sample using a linear temperature sensor (in our case...

  • Optoelectronic characterization by photothermal deflection: Single-crystalline semiconductors. Grunow, P.; Kunst, M. // Journal of Applied Physics;3/15/1995, Vol. 77 Issue 6, p2767 

    Examines the use of the photothermal deflection (PD) technique for the characterization of semiconductors by measurements on crystalline silicon and CdS. Configuration for PD inside a semiconductor; Information on the PD signal measured for different surface preparations.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics