Transverse magnetoresistance: A novel two-terminal method for measuring the carrier density and

Lowney, Jeremiah R.; Thurber, W. Robert
May 1994
Applied Physics Letters;5/30/1994, Vol. 64 Issue 22, p3015
Academic Journal
Determines the free-carrier density and mobility of a semiconductor layer using transverse magnetoresistance. Derivation of an equation for the magnetoresistance; Data on the electron density and mobility accumulation layers; Implication of the photoconductive infrared detectors for processing methods and quality control.


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