Study of the defects induced by low-energy (100 eV) hydrogen-ions on amorphous silicon dioxide

Fortunato, G.; Mariucci, L.
March 1992
Applied Physics Letters;3/30/1992, Vol. 60 Issue 13, p1564
Academic Journal
Examines the defects induced by low-energy hydrogen-ion bombardment on amorphous silicon dioxide. Use of synchrotron radiation photoemission spectroscopy; Comparison between the effects induced by bombarding hydrogen ion and argon ion; Differentiation between physical and chemical characters in hydrogen/amorphous silica interaction.


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