High-speed characterization of p-i-n photodetectors by nonlinear photocurrent spectroscopy

Bender, G.; Schneider, H.
August 1994
Applied Physics Letters;8/1/1994, Vol. 65 Issue 5, p613
Academic Journal
Investigates the carrier transport and electric field recovery in high-speed p-i-n photodetectors by nonlinear photocurrent spectroscopy. Origin of the nonlinearity; Distortion of the electric field by the free carriers generated by the leading pulse; Enhancement of the nonlinear signal by orders of magnitude at suitable excitation wavelengths.


Related Articles

  • The role of Ca traces in the passivation of silicon dioxide dielectrics for electron transport in pentacene organic field effect transistors. Benson, Niels; Gassmann, Andrea; Mankel, Eric; Mayer, Thomas; Melzer, Christian; Schmechel, Roland; von Seggern, Heinz // Journal of Applied Physics;Sep2008, Vol. 104 Issue 5, p054505 

    Recently, n-type transport in organic field effect transistors (OFETs) incorporating pentacene on a silicon dioxide (SiO2) dielectric has been demonstrated by Ahles et al. [Appl. Phys. Lett. 85, 4499 (2004)]. The electron transport was made possible by modifying the dielectric/semiconductor...

  • Field-dependent transport of electrons in selectively doped AlGaAs/GaAs/AlGaAs double-heterojunction systems. Inoue, Kaoru; Sakaki, Hiroyuki; Yoshino, Junji // Applied Physics Letters;9/15/1985, Vol. 47 Issue 6, p614 

    The transport properties of high-mobility electrons in selectively doped AlGaAs/GaAs/AlGaAs double-heterojunction systems have been investigated for electric fields (E) up to several kV/cm by pulsed Hall and pulsed current-voltage measurements. It was found that electron mobilities began to...

  • Formation of electron internal transport barrier and achievement of high ion temperature in Large Helical Device. Takeiri, Y.; Shimozuma, T.; Kubo, S.; Morita, S.; Osakabe, M.; Kaneko, O.; Tsumori, K.; Oka, Y.; Ikeda, K.; Nagaoka, K.; Ohyabu, N.; Ida, K.; Yokoyama, M.; Miyazawa, J.; Goto, M.; Narihara, K.; Yamada, I.; Idei, H.; Yoshimura, Y. // Physics of Plasmas;May2003, Vol. 10 Issue 5, p1788 

    An internal transport barrier (ITB) was observed in the electron temperature profile in the Large Helical Device [O. Motojima et al., Phys. Plasmas 6, 1843 (1999)] with a centrally focused intense electron cyclotron resonance microwave heating. Inside the ITB the core electron transport was...

  • Electronic and chemical properties of the TaN/a-SiOC:H stack studied by photoelectron spectroscopy for advanced interconnects. Martinez, E.; Guedj, C.; Mariolle, D.; Licitra, C.; Renault, O.; Bertin, F.; Chabli, A.; Imbert, G.; Delsol, R. // Journal of Applied Physics;Oct2008, Vol. 104 Issue 7, p073708 

    Thin TaN metallic barriers are used to prevent copper diffusion into porous low-k dielectrics such as a-SiOC:H for advanced interconnects. We investigate the detailed electronic properties of the TaN/a-SiOC:H stack. Here we combine ultraviolet and x-ray photoelectron spectroscopy to measure the...

  • Keldysh theory of strong-field ionization. Zi Jian Long; Wing-Ki Liu // Canadian Journal of Physics;Apr2010, Vol. 88 Issue 4, p227 

    In this paper, we provide a detailed derivation of the strong-field ionization rates originally developed by Keldysh who introduced the strong-field approximation. Numerical results are presented to examine the saddle-point approximation, the low photoelectron energy approximation, and...

  • A threshold photoelectron-photoion coincidence spectrometer with double velocity imaging using synchrotron radiation. Xiaofeng Tang; Xiaoguo Zhou; Mingli Niu; Shilin Liu; Jinda Sun; Xiaobin Shan; Fuyi Liu; Liusi Sheng // Review of Scientific Instruments;Nov2009, Vol. 80 Issue 11, p113101 

    A novel threshold photoelectron-photoion coincidence (TPEPICO) imaging spectrometer at the U14-A beamline of the Hefei National Synchrotron Radiation Laboratory is presented. A set of open electron and ion lenses are utilized to map velocity imaging of photoelectrons and photoions...

  • Energy broadening due to photoion space charge in a high resolution laser photoelectron source. Bo¨mmels, J.; Leber, E.; Gopalan, A.; Weber, J. M.; Barsotti, S.; Ruf, M.-W.; Hotop, H. // Review of Scientific Instruments;Nov2001, Vol. 72 Issue 11, p4098 

    The results of experimental and theoretical studies, aiming at a quantitative characterization of photoion-induced energy broadening effects in a laser photoelectron source, are reported. The electron source is based on two-step cw laser photoionization of potassium atoms in a collimated beam....

  • Direct imaging of optical diffraction in photoemission electron microscopy. Word, Robert C.; Fitzgerald, J. P. S.; Könenkamp, Rolf // Applied Physics Letters;7/8/2013, Vol. 103 Issue 2, p021118 

    We report the visualization of optical diffraction at the boundaries of semiconductor and metal nanostructures in non-linear photoemission electron microscopy. We observe light diffracting into photonic and plasmonic modes of planar samples, and into photonic vacuum modes above sample surfaces....

  • Non-destructive depth compositional profiles by XPS peak-shape analysis. López-Santos, M. C.; Yubero, F.; Espinós, J. P.; González-Elipe, A. R. // Analytical & Bioanalytical Chemistry;Apr2010, Vol. 396 Issue 8, p2757 

    The measured peak shape and intensity of the photoemitted signal in X-ray photoelectron spectroscopy (XPS) experiments (elastic and inelastic parts included) are strongly correlated, through electron-transport theory, with the depth distribution of photoelectron emitters within the analyzed...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics