TITLE

X-ray photoelectron spectroscopy measurement of valence-band offsets for Mg-based semiconductor

AUTHOR(S)
Wang, M.W.; Swenberg, J.F.
PUB. DATE
June 1994
SOURCE
Applied Physics Letters;6/20/1994, Vol. 64 Issue 25, p3455
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Uses x-ray photoelectron spectroscopy to measure the valence-band offsets for manganese (Mg)-based heterojunctions. Values obtained for the valence-band offsets of the respective heterojunction; Deviation of the values from the common anion rule; Application of the results to the design of current II-VI wide band-gap light emitters.
ACCESSION #
4258384

 

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