Measurement of composition in Hg[sub 1-x]Cd[sub x]Te epilayers

Kun Liu; Chu, J.H.
May 1994
Applied Physics Letters;5/23/1994, Vol. 64 Issue 21, p2818
Academic Journal
Presents a model for evaluating the composition distribution in mercury cadmium telluride epitaxy materials. Details of reflection coefficient, thickness and refractive index of different layers; Evidence for the composition deviation in the transverse direction; Use of the second ionized mass spectroscopy to assess the composition profile of cadmium.


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