High-speed optical sampling measurement of electrical wave form using a scanning tunneling

Takeuchi, Koichiro; Kasahara, Yukio
December 1993
Applied Physics Letters;12/27/1993, Vol. 63 Issue 26, p3548
Academic Journal
Demonstrates the optical sampling measurement of a high-speed electrical wave form using a scanning tunneling microscope. Measurement of a signal from a Schottky barrier diode in a sampling procedure; Achievement of a time resolution less than 300 picosecond; Potential of the method to create a breakthrough in ultra-high-speed wave form measurement.


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