Atomic force microscope investigation of C[sub 60] adsorbed on silicon and mica

Thundat, T.; Warmack, R.J.
August 1993
Applied Physics Letters;8/16/1993, Vol. 63 Issue 7, p891
Academic Journal
Examines the morphological and frictional characteristics of fullerenes adsorbed on silicon and mica surfaces. Use of atomic force microscopy for surface structure study of monolayer coverages; Effect of fullerene deposition by vacuum sublimation on microcrystallites; Characteristics of the surfaces based on small area scans and frictional measurements.


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