TITLE

Atomic force microscope investigation of C[sub 60] adsorbed on silicon and mica

AUTHOR(S)
Thundat, T.; Warmack, R.J.
PUB. DATE
August 1993
SOURCE
Applied Physics Letters;8/16/1993, Vol. 63 Issue 7, p891
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the morphological and frictional characteristics of fullerenes adsorbed on silicon and mica surfaces. Use of atomic force microscopy for surface structure study of monolayer coverages; Effect of fullerene deposition by vacuum sublimation on microcrystallites; Characteristics of the surfaces based on small area scans and frictional measurements.
ACCESSION #
4258227

 

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