Relationship among reflectance-difference spectroscopy, surface photoabsorption, and

Hingerl, K.; Aspnes, D.E.
August 1993
Applied Physics Letters;8/16/1993, Vol. 63 Issue 7, p886
Academic Journal
Examines the analytic connections among reflectance-difference spectroscopy, surface photoabsorption and spectroellipsometry data. Use of the reflectance expressions for a thin biaxial layer on an isotropic substrate; Realization of all three approaches in a single apparatus; View of the procedures as complementary approaches.


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