X-ray photoelectron spectroscopy study for Nb Josephson junctions with overlayer structure

Shigeno, Mayumi; Morohashi, Shin'ichi
August 1992
Applied Physics Letters;8/17/1992, Vol. 61 Issue 7, p855
Academic Journal
Investigates the metal/niobium (Nb) junctions with thin overlayers using x-ray photoelectron spectroscopy. Preparation of the samples by direct current magnetron sputtering; Examination of the aluminum overlayer coverage of Nb; Factors influencing the quality of the fabricated junctions.


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