X-ray photoemission diffraction as a novel technique for antiphase domain detection in the

Olivier, J.; Bartenlian, B.
August 1992
Applied Physics Letters;8/17/1992, Vol. 61 Issue 7, p766
Academic Journal
Presents X-ray photoemission diffraction as a technique for antiphase domain detection in the epitaxial growth of polar compounds on nonpolar substrates. Unsuitability of the reflection high-energy electron diffraction method; Example in the case of gallium arsenide growth on a patterned silicon substrate; Use of scanning transmission electron microscopy.


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