TITLE

Bilayer reflection-high-energy-electron-diffraction intensity oscillations observed during

AUTHOR(S)
Ohtani, N.; Mokler, S.M.
PUB. DATE
September 1992
SOURCE
Applied Physics Letters;9/21/1992, Vol. 61 Issue 12, p1399
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Observes the bilayer reflection-high-energy-electron diffraction (RHEED) intensity oscillations on silicon substrate grown by silicon gas-source molecular beam epitaxy. Observation of bilayer-mode oscillation in the azimuth; Transformation of oscillations from monolayer waveform to bilayer mode; Effects of surface anisotropy on RHEED intensity oscillation period.
ACCESSION #
4254997

 

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