TITLE

Measurement of elastic relaxation in cross-sectional transmission electron microscopy of

AUTHOR(S)
Duan, X.F
PUB. DATE
July 1992
SOURCE
Applied Physics Letters;7/20/1992, Vol. 61 Issue 3, p324
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the relaxation in the cross-sectional transmission electron microscopy samples of the Ge[sub x]Si[sub 1-x]/Si strained-layer superlattices. Absence of misfit dislocations in the superlattice-substrate interface; Occurrence of relaxation upon the thinning of the specimen; Determination of germanium content.
ACCESSION #
4254920

 

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