Scanning tunneling microscopy and spectroscopy of Si/SiGe(001) superlattices

Yu, E.T.; Halbout, J.-M.
December 1992
Applied Physics Letters;12/28/1992, Vol. 61 Issue 26, p3166
Academic Journal
Examines the modulation-doped silicon/silicon germanide superlattice using scanning tunneling microscopy. Effect of carrier distribution on tunneling current; Electronic contrast between semiconductors by topographic images; Detection of band-edge discontinuities by spectroscopic measurements.


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