Microluminescence depth profiles and annealing effects in porous silicon

Prokes, S.M.; Freitas Jr., J.A.
June 1992
Applied Physics Letters;6/29/1992, Vol. 60 Issue 26, p3295
Academic Journal
Examines the effects of annealing and microluminescence depth profiles in porous silicon. Absence of spectral shift; Independence of depth from luminescence spectra redshift; Influence of annealing temperature on luminescence redshift; Role of hydrogen in optical band shrinkage.


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