TITLE

Scanning probe microscopy and scanning tunneling spectroscopy of porous silicon

AUTHOR(S)
Amisola, G.B.; Behrensmeier, R.
PUB. DATE
November 1992
SOURCE
Applied Physics Letters;11/23/1992, Vol. 61 Issue 21, p2595
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Investigates the use of scanning probe microscopy (SPM) and scanning tunneling spectroscopy (STS) on anodically etched porous silicon (Si). Effects of etching on the vertical surface of Si; Difference between SPM and STS porous Si surface images; Comparison between the band gap energy of porous and crystalline Si.
ACCESSION #
4250602

 

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