TITLE

Quantitative element analysis in high resolution electron microscopy in both phases of

AUTHOR(S)
van Bouwelen, Frank; Sietsma, Jilt
PUB. DATE
November 1992
SOURCE
Applied Physics Letters;11/23/1992, Vol. 61 Issue 21, p2536
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the element analysis of high resolution electron microscopy in nanocrystalline Fe[sub 75.5]Cu[sub 1]Nb[sub 3]Si[sub 12.5]B[sub 8] phases. Formation of amorphous semiconductors in ribbon following a melt spinning technique; Distinction between crystalline and the amorphous niobium-content element; Impact of niobium diffusion on the crystal growth.
ACCESSION #
4250582

 

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