Surface structure of hydrated amorphous silicon oxide at 3 Angstrom resolution by scanning force

Tillmann, Ralf W.; Radmacher, Manfred
June 1992
Applied Physics Letters;6/22/1992, Vol. 60 Issue 25, p3111
Academic Journal
Examines the topology of a hydrated amorphous silicon oxide surface with a scanning force microscope. Independence of the measured surface reliefs from the local tip shape; Indication of the occurrence of surface rearrangement; Reason behind the decay of the surface relief; Features of the image time sequence.


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