Residual stresses and microstructure of Ag-Ni multilayers

Badawi, K.-F.; Durand, N
December 1994
Applied Physics Letters;12/12/1994, Vol. 65 Issue 24, p3075
Academic Journal
Examines the residual stresses in very-low period silver-nickel multilayer thin films by x-ray diffraction utilizing the sin[sup 2]psi method. Maximum thinness of the layers measured for stresses; Exclusion of interfacial coherency relationship in the stress measurements; Analysis of multilayer microstructure variations with respect to the period.


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