TITLE

Reflection high-energy electron diffraction intensity oscillations of germanium growth on

AUTHOR(S)
Xie, M.H.; Zhang, J.
PUB. DATE
December 1994
SOURCE
Applied Physics Letters;12/12/1994, Vol. 65 Issue 24, p3066
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents the reflection high-energy electron diffraction intensity oscillations during germanium growth on silicon(100) using gas source molecular beam epitaxy from gaseous hydrides. Temperature range of observed oscillations over six monolayers of growth; Interpretation of varying oscillation frequency; Contributions of surface roughening effects.
ACCESSION #
4241426

 

Related Articles

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics