Characterization of the near-interface region of chemical vapor deposited diamond films on

Geier, S.; Schreck, M.
October 1994
Applied Physics Letters;10/3/1994, Vol. 65 Issue 14, p1781
Academic Journal
Examines the lattice orientations near the interface of chemical vapor deposited diamond films on silicon by orientation imaging microscopy. Analysis on electron backscatter Kikuchi diffraction patterns; Existence of epitaxially nucleated grains; Deduction of high amount twinned diamond; Monitor and quantification of the occurring twin boundaries.


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