TITLE

Characterization of the near-interface region of chemical vapor deposited diamond films on

AUTHOR(S)
Geier, S.; Schreck, M.
PUB. DATE
October 1994
SOURCE
Applied Physics Letters;10/3/1994, Vol. 65 Issue 14, p1781
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the lattice orientations near the interface of chemical vapor deposited diamond films on silicon by orientation imaging microscopy. Analysis on electron backscatter Kikuchi diffraction patterns; Existence of epitaxially nucleated grains; Deduction of high amount twinned diamond; Monitor and quantification of the occurring twin boundaries.
ACCESSION #
4241392

 

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