Influence of oxide charge on minority-carrier lifetime in metal-oxide-semiconductor capacitors

Meinertzhagen, A.; Rharbi, S. El
May 1992
Applied Physics Letters;5/4/1992, Vol. 60 Issue 18, p2222
Academic Journal
Examines the effects of the oxide charge on minority carrier lifetime in metal oxide semiconductor capacitors. Relation between the presence of oxide charge and the increase of time; Influence of high field stresses on the oxide charge and the interface; Effect of high leakage current on metal oxide semiconductor capacitors.


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