TITLE

Surface analysis of a GaAs electron source using Rutherford backscattering spectroscopy

AUTHOR(S)
Calabrese, R.; Guidi, V.
PUB. DATE
July 1994
SOURCE
Applied Physics Letters;7/18/1994, Vol. 65 Issue 3, p301
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Measures the amount of cesium (Cs) on the surface of gallium arsenide (GaAs) photocathode activated in negative electron affinity conditions. Use of Rutherford backscattering spectroscopy; Absence of Cs desorption from the GaAs surface; Reactivation of photocathode surface through Cs feeding.
ACCESSION #
4240961

 

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