Moving grating technique: A new method for the determination of electron and hole mobilities and

Haken, U.; Hundhausen, M.
November 1993
Applied Physics Letters;11/29/1993, Vol. 63 Issue 22, p3066
Academic Journal
Presents a method for determining the mobilities and lifetime of photogenerated electrons and holes in semiconductors. Reliance of the technique on the short circuit current; Derivation of the theoretical expressions for the current; Implementation of the technique to an amorphous silicon:hydrogen crystals.


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