Determination of surface lattice strain in ZnTe epilayers on {100}GaAs by ion channeling and

Lovergine, N.; Cingolani, R.
December 1993
Applied Physics Letters;12/20/1993, Vol. 63 Issue 25, p3452
Academic Journal
Examines the direct measurements of surface lattice strain in zinc telluride (ZnTe) epitaxial layers on {100}gallium arsenide substrates. Use of ion channeling and reflectance measurements to determine surface strain values; Comparison between ion channeling data and parallel strain values; Process involved to obtain ZnTe residual compressive strain.


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