TITLE

Characterization of atomic force microscope tips by adhesion force measurements

AUTHOR(S)
Thundat, T.; Zheng, X-Y.
PUB. DATE
October 1993
SOURCE
Applied Physics Letters;10/11/1993, Vol. 63 Issue 15, p2150
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the atomic force microscope tips using adhesion force measurements. Relationship between adhesion force and relative humidity; Decrease in adhesion force by ultraviolet-ozone cleaning; Description of the methods to determine and reduce the extent of tip contamination.
ACCESSION #
4240864

 

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