TITLE

High-resolution transmission electron microscopy study of the radiation damage defects in high

AUTHOR(S)
Zhao, Y.Z.; Chu, W.K.
PUB. DATE
October 1992
SOURCE
Applied Physics Letters;10/19/1992, Vol. 61 Issue 16, p1968
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the use of high-resolution transmission electron microscopy to study the radiation damage defects in high temperature conductors. Mechanism for the formation of radiation damage defects; Displacement of the crystal atoms; Increase in the size of defect clusters.
ACCESSION #
4240774

 

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