TITLE

Highly sensitive Moire technique for direct and real-time observation of electron microscopic

AUTHOR(S)
Ru, Q.; Endo, J.
PUB. DATE
June 1992
SOURCE
Applied Physics Letters;6/8/1992, Vol. 60 Issue 23, p2840
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Proposes the use of an interference electron microscope to investigate the highly sensitive Moire technique. Presentation of the analogue and digital formations of sine-functioned Moire modulation; Sensitivity of the Moire technique; Variation of fluxons due to temperature change; Use of the digital method for real-time observation.
ACCESSION #
4240709

 

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