Highly sensitive Moire technique for direct and real-time observation of electron microscopic

Ru, Q.; Endo, J.
June 1992
Applied Physics Letters;6/8/1992, Vol. 60 Issue 23, p2840
Academic Journal
Proposes the use of an interference electron microscope to investigate the highly sensitive Moire technique. Presentation of the analogue and digital formations of sine-functioned Moire modulation; Sensitivity of the Moire technique; Variation of fluxons due to temperature change; Use of the digital method for real-time observation.


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