Effect of the barrier thickness on interface defect density in

Wang, F.; Fischer, T.
November 1994
Applied Physics Letters;11/28/1994, Vol. 65 Issue 22, p2798
Academic Journal
Presents a systematic constant photocurrent spectra (CPM) study of a series of alpha-Si:H/a-Si[sub 1-x]C[sub x]:H multilayers with different thickness. Manifestation of the apparent defect absorption and apparent Urbach energy in CPM spectra; Evaluation of the interface defect density; Details concerning the depositions.


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