TITLE

Strain in pseudomorphic films growth on arbitrarily oriented substrates

AUTHOR(S)
Kai Yang; Anan, Takayoshi
PUB. DATE
November 1994
SOURCE
Applied Physics Letters;11/28/1994, Vol. 65 Issue 22, p2789
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Examines the strain in pseudomorphic thin films grown on arbitrarily oriented substrates. Presentation of the film constraint equations for the unit translation vectors; Calculation of the strain through energy minimization; Expression of the strain and rotation tensors.
ACCESSION #
4233193

 

Related Articles

  • Elastic Domain Architectures in Constrained Layers. Slutsker, J.; Artemev, A.; Roytburd, A. L. // AIP Conference Proceedings;2002, Vol. 626 Issue 1, p266 

    The formation of elastic domains in transforming constrained films is a mechanism of relaxation of internal stresses caused by the misfit between a film and a substrate. The formation and evolution of polydomain microstructure as a result of the cubic-tetragonal transformation in a constrained...

  • A Simple Technique for Determining Yield Strength of Thin Films. M.H. Gordon // Experimental Mechanics;Sep2002, Vol. 42 Issue 3, p232 

    A technique to measure the yield strength of thin films has been developed which combines experimental observations of deflection and plastic deformation with finite element predictions of stress. This technique relies on integrated circuit technology to build bridge and cross beam test...

  • Reduced critical thickness for relaxing heteroepitaxial films on compliant substrates. Kästner, G.; Gösele, U. // Applied Physics Letters;5/12/2003, Vol. 82 Issue 19, p3209 

    It is argued that heteroepitaxial thin films (layers) grown on a compliant substrate are not able to relax their strain elastically by large-area slip across a "weak" layer. Instead, the Matthews model of plastic relaxation is modified by supposing that the interfacial misfit dislocations relax...

  • Strained film deposition on thin substrates: Resulting internal strains with an application to prestrained and preshaped multilayered membranes for a soft-x-ray window. Mutikainen, R. // Journal of Applied Physics;10/1/1994, Vol. 76 Issue 7, p4130 

    Presents a study which derived the substrate shrinkage or expansion and nonuniform strain distributions within the deposited thin film. Process which leads to the phenomenon of substrate bending; Analysis of the strain fields within the deposited film and the substrate; Model to describe the...

  • Predicted thermally induced stresses in, and the bow of, a circular substrate/thin-film structure. Suhir[a], E. // Journal of Applied Physics;9/1/2000, Vol. 88 Issue 5, p2363 

    Describes the development of a simple analytical stress model for the evaluation of the thermally induced stresses in, and the bow of, a circular substrate/thinfilm structure. Ability to predict and minimize the thermally induced stresses and deflections in such a structure; Consequence of the...

  • Relief of compressive biaxial strains in thin films via microtwins. Twigg, M. E.; Richmond, E. D.; Pellegrino, J. G. // Journal of Applied Physics;4/15/1990, Vol. 67 Issue 8, p3706 

    Presents a study which investigated the strain relief of compressive biaxial strains in thin films through microtwins. Experimental details; Results and discussion; Conclusions.

  • Stress analysis of Al[sub x]Ga[sub 1-x]N films with microcracks. Rudloff, D.; Riemann, T.; Christen, J.; Liu, Q. K. K.; Kaschner, A.; Hoffmann, A.; Thomsen, Ch.; Vogeler, K.; Diesselberg, M.; Einfeldt, S.; Hommel, D. // Applied Physics Letters;1/20/2003, Vol. 82 Issue 3, p367 

    Thick Al[SUBx]Ga[SUB1-x]N epilayer with microcracks grown by metalorganic vapor-phase epitaxy on a GaN buffer above a (0001) sapphire substrate was comprehensively characterized by spatially and spectrally resolved cathodoluminescence (CL) and micro-Raman (μ-Raman) spectroscopy. The variation...

  • Publisher's Note: 'Compositional dependent thin film stress states' [J. Appl. Phys. 108, 043506 (2010)]. Fu, B.; Thompson, G. B. // Journal of Applied Physics;Oct2010, Vol. 108 Issue 7, p079904 

    A correction to the article "Compositional dependent thin film stress states," by B. Fu and G. B. Thompson, published in a 2010 issue, is presented.

  • Effects of stress on the growth of TiSi[sub 2] thin films on (001)Si. Cheng, S.L.; Huang, H.Y. // Applied Physics Letters;3/8/1999, Vol. 74 Issue 10, p1406 

    Studies the effects of stress on the growth of TiSi[sub 2] thin films on (001)Si. Effects of tensile stress on the growth of C54-TiSi[sub 2]; Relationship between the thickness of TiSi[sub 2] and the tensile and compressive levels; Factors contributing to growth retardation.

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics